TCS Launches AI-powered Solution to Detect Wafer Anomaly in Semiconductor Manufacturing

By Ralph Rio

Category:
Company and Product News

Tata Consultancy Services announced the launch of TCS WaferWise, a cloud-based wafer anomaly detection solution that harnesses the company’s contextual knowledge of the semiconductor industry and the power of deep learning technology, to help chip makers digitally reimagine their product quality assurance process.

Sophisticated quality inspection of wafers during the semiconductor manufacturing process is essential to detect and classify defects early and accurately, as well as improve quality.  Several companies still run manual inspections that rely heavily on human expertise.  This makes the process prone to errors, and limits manufacturing throughput.

TCS WaferWise is a cloud-based solution that leverages custom AI models to automatically detect and classify anomalies by analyzing nano-scale images generated during the semiconductor manufacturing process.  The solution runs on Google Cloud and utilizes TCS’ Continuous Learning Platform to effectively sample different datasets across multiple manufacturing lines and automatically trigger learning when required, steadily enhancing the accuracy of the AI model.

 

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